Lock-in Thermography

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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)
By Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp




&#8226ublisher:  Springer
•Number Of Pages:  255
&#8226ublication Date:  2010-09-07
•ISBN-10 / ASIN:  3642024165
•ISBN-13 / EAN:  9783642024160


Product Description:

This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.


http://ifile.it/hvu3xmo/thermography.pdf